The Monitored Burn-In (MBI) System operates the device at high temperatures and determines faults in the sample while comparing the output value and expected value of the device.
Test patterns required for memory and logic can be easily created, and high productivity can be achieved. In addition, the pattern generator, driver and chamber are in separate modules, and a variety of test environments can be supported from reliability testing to screening.
|Model||Target specimen||Main specifications|
|MBI-2||Memory, MPU, system LSI||Number of channels: 48
VIH +1.5 V to +7 V
PS1 +1.0 to +10.0 V/16 A