Monitored Burn-In System

This monitor burn-in system tests for devices such as logic and system LSI in a temperature environment.
It is possible to pass/fail the quality of the sample while comparing the output value from the device and the expected value.

The necessary for test patterns can be created, providing high productivity.
The system is modularized, and from reliability testing to screening, ESPEC provide the optimum test environment according to customer purpose, test temperature and heat load.

Model Target specimen Main Specifications
MBI Logic device, System LSI Number of channels: 56ch
VIH +0.8V 〜 +10.0V
4Power Supplies (PS1〜PS4)