Electro-chemical Migration Evaluation System
Overview of Equipment
More accurate evaluation of insulation resistance
As electronic devices become smaller and denser, electro-chemical migration evaluation and insulation evaluation have become more important. This system can constantly monitor these evaluations more accurately and more efficiently. This system enables easy and efficient insulation resistance evaluation and life evaluation when electro-chemical migration occurs, and it has various applications, from low voltage testing to high voltage testing.
Main specifications
Please scroll horizontally to look at table below.
| Resistance measurement range (Ω) | 2.0×105 to 1.0×1013(when 100 V is applied) 2.0×103 to 1.0×1011(when 1 V is applied) |
|
|---|---|---|
| Channel configuration | 25 to 300 ch per rack | |
| Channel control | 5ch | 25ch |
| Measurement voltage | DC1.0 to 100V (0.1V increments) | |
| Leak touch detection speed | Constant detection at less than 100 µsec | |
Features
- Tests from low-voltage to high-voltage ranges can be conducted
- Uniquely designed event detectors
- To meet your applications and objectives, from evaluation of low voltage of mobile devices to on-board high voltage devices, we offer a lineup of optional stress constant voltage specifications, including 100 V, 300 V, and 500 V.
- High-accuracy measurement
- This is a measurement device (150 ch/ device) that conforms to international standards measures all samples, reducing variation in measured values among different channels.
- Improved workability and higher efficiency at regular part replacements
- Installing a connection unit allows the measurement cables to be easily installed and removed.
The connection unit can be installed on the rack front or on the left or right side, for use according to the installation environment.
- Measurement cable
Used for each 5 ch connectors.
- Real-time monitoring of 4 environmental test chambers (via Ethernet connection)
- Example of connection to a Bench-top Type Temperature (& Humidity) Chamber
- Connecting jig (optional)
- We offer a connecting jib to best suit your specimen. It enables easy connection of specimen and cable for efficient testing.
- Connecting jig (optional)
Recommended products for customers viewing this product
Measurement & Evaluation Systems / Semiconductor-related Equipment
-
Measurement & Evaluation Systems
- Electro-chemical Migration Evaluation System
- High Voltage Bias Insulation Resistance Evaluation System
- PID（Potential Induced Degradation）Evaluation System
- Capacitor Leakage Test System
- High Temperature Reverse Bias Test System
- TDDB (Time-Dependent Dielectric Breakdown) Evaluation System
- Conductor Resistance Evaluation System (AMR)
- Electromigration Evaluation System (AEM-2000)
- PV Thermal-Bias Combo Test System
- Semiconductor Parametric Test System
- Capasitor / Inductor Temperature Characteristic Evaluation System
- PV I-V Evaluation System (PV Thermal-Light Combo Test System)
- Power Cycle Test System
- Semiconductor-related Equipment
