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Large Highly Accelerated Stress Test System
(HAST Chamber)

Overview of Equipment

There is now an even greater need for highly accelerated stress tests of parts and materials, as electrical and electronic components have become denser. The Highly Accelerated Stress Test System (HAST Chamber) is designed primarily for bias testing using a set applied voltage and signal.
Control functions can be selected from the standard two-modes of unsaturated control and wet-saturated control, and the three-modes of dry & wet-bulb temperature control, unsaturated control and wet-saturated control (M type). The M type chamber can be used for pressure cooker tests and unsaturated pressure cooker tests. Although it is quite large, the chamber conforms to the international standard IEC-60068-2-66.
Our range of chambers also includes a long type with greater depth. In addition to the standard HAST Chamber, we also offer larger sizes than standard type.

Features
  • Achieve shorter test times compared to humidity resistance tests under ordinary pressure
  • Available in two larger capacity types, in addition to the standard types.
  • Features a standard mechanical door lock mechanism and door lock safety mechanism
Conforms to various testing standards for semiconductors
IEC 60068-2-66 Compact electrical and electronic components (mainly non-hermetically sealed components) Unsaturated
IEC 60749-4 Semiconductor devices Unsaturated
EIAJ ED-4701 Semiconductor devices Unsaturated
JESD22-A110E Non-hermetically sealed (not hollow) device Unsaturated
JESD22-A102E Non-hermetically sealed IC discrete device Saturated

* We recommend the M type chambers for tests conforming to the above testing standards.

Conforms to other testing standards
JIS C 60068-2-66 Aluminum metal corrosion of integrated circuits and semiconductor devices Unsaturated
JPCA-ET08-2002 Printed circuit boards Unsaturated
Specifications

Please scroll horizontally to look at table below.

Model EHS-432(M) * (M) Features dry & wet-bulb temperature control
Dimensions Test chamber internal dimensions φ548mm×L560mm
External dimensions (W×H×D) W800×H1575×D1260 mm
Performance Unsaturated control Temperature control range 105.0 - 162.2°C
Humidity control range 75 - 100%rh
Pressure range 0.0196 - 0.392MPa(Gauge)
Heating and pressurization time (at RT.23°C): approximately 90 minutes
Wet-saturated control Temperature control range 105.0 - 151.1°C
Pressure range 0.0196 - 0.392MPa(Gauge)
Heating and pressurization time (at RT.23°C): approximately 90 minutes
Dry & wet-bulb temperature control (M type) Temperature control range 105.0 - 162.2°C
Humidity control range 75 - 95%rh
Pressure range 0.0196 - 0.392MPa(Gauge)
Heating and pressurization time (at RT.23°C): approximately 120 minutes

Please scroll horizontally to look at table below.

Model EHS-432(M)-L L: Long-type Chamber
Dimensions Test chamber internal dimensions φ548mm×L760mm
External dimensions (W×H×D) W800×H1575×D1460 mm
Performance Unsaturated control Temperature control range 105.0 - 162.2°C
Humidity control range 75 - 100%rh
Pressure range 0.0196 - 0.392MPa(Gauge)
Heating and pressurization time (at RT.23°C): approximately 120 minutes
Wet-saturated control Temperature control range 105.0 - 151.1°C
Pressure range 0.0196 - 0.392MPa(Gauge)
Heating and pressurization time (at RT.23°C): approximately 120 minutes
Dry & wet-bulb temperature control (M type) Temperature control range 105.0 - 162.2°C
Humidity control range 75 - 95%rh
Pressure range 0.0196 - 0.392MPa(Gauge)
Heating and pressurization time (at RT.23°C): approximately 150 minutes
Remarks:
The Large Highly Accelerated Stress Test System (HAST Chamber) (EHS-432) is a regulated class-1 pressure vessel. (* The long-type chamber EHS-432L is also a regulated class-1 pressure vessel.) This requires you to complete the necessary procedures for submitting a Notification of Installation and Application for Completion Inspection and Conducting a Completion Inspection to the Labor Standards Inspection Office in your jurisdiction 30 days prior to delivery of the chamber. Also, when operating and managing the chamber, you will need to appoint a chief worker for handling an ordinary class-1 pressure vessel.
Please note that when exporting the chamber overseas, the pressure vessel may be subject to restrictions due to the applicable standards. Please inquire for further details.
  • * The wide-range HAST test, whisker accelerated test, and air HAST test are adjusted according to their individual requirements. Please contact our sales representatives.
  • * We can supply specimen power supply terminals in accordance with the customer's requested specifications. Please contact our sales representatives.
  • * A request for the application of high voltage inside the chamber area may cause an electrical discharge to occur within the chamber. We will individually respond to each request after checking the specifications in detail. Please contact our sales representatives. Please note that we may not be able to meet this request if the creepage distance cannot be secured or for other reasons. We apologize in advance for the inconvenience.
Test examples
  • Wire bonding conduction evaluation
Specimen: Semiconductor packages
Test conditions: 130°C/85%rh 100h
  • LED humidity degradation evaluation
Specimen: LED
Test conditions: 105°C/87%rh 250h
  • Whisker evaluation
Specimen: Printed board
Test conditions: 120°C/85%rh 2500h
  • Migration evaluation
Specimen: Printed board
Test conditions: 110°C/85%rh 100h, 130°C/85%rh 400h

* Compared to ordinary temperature and humidity exposure, the HAST Chamber allows you to conduct saturated and unsaturated tests in a shorter time and with the ability to reproduce certain conditions. The chamber can be used to conduct tests conforming to IEC-68-2-66, IEC749, EIAJ ED-4701 and other leading standards.

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