THB (Temperature Humidity Bias) Evaluation System
![]()
Overview of Equipment
The THB Evaluation System is a reliability test system that applies voltage at high temperature and humidity to allow automotive semiconductors, etc. to achieve high reliability under rigorous conditions compared to consumer semiconductors.
It can tolerate a device heat-generation load of up to 300 W under conditions of 85°C/85% RH.
Upon request, we can propose optimal systems for various types of static burn-in, temperature and humidity ranges, number of tests, etc.
- Features and application
-
- Achieve highly accurate temperature and humidity control over a wide range
With the use of a refrigerator system equipped with a no-stage control electronic expansion valve, highly accurate temperature and humidity control can be achieved over a wide range not only for a normal environment of 85°C and 85% RH. - Highly accurate temperature and humidity control even with high heat generation
With the use of a large air capacity sirocco fan and a chamber rack structure that ensures temperature uniformity, this system enables high accuracy testing even at device heat generation of up to 300 W. (Allowable heat of 300 W at 85°C and 85% RH) - Low noise level
The exhaust heat blower, which accounts for much of the noise generated by the chamber, is equipped with a low-noise level fan to greatly contribute to an improvement in the equipment environment. - Environmentally-friendly system
With a design focused on recycling, the use of HFC refrigerant with a zero ozone layer depletion coefficient, and a space-saving ceiling ventilation system (air cooled system), this product was designed with the environment in mind.
- Achieve highly accurate temperature and humidity control over a wide range
- Appearance/system block diagram (example)

Specifications
Please scroll horizontally to look at table below.
| Item | Specifications |
|---|---|
| Temperature/humidity range | -10 to +100°C/50 to 95% RH |
| Temperature and humidity distribution performance | ±2°C/±5%RH (no specimen) |
| Allowable heat load | 300 W (85°C/85% RH) |
| External dimensions Chamber System rack |
1583 (W) × 1970 (H) × 1347 (D) mm 530 (W) × 1810 (H) × 1200 (D) mm |
| DUT power specifications | Customized to your needs |
| Clock specifications | Customized to your needs |
| DUT power supply input cutoff | Sequence can be operated by program |
| Burn-in controller (touch panel) | Burn-in time setting Remaining burn-in time monitor DUT power supply, clock signal ON/OFF, operation sequence by zone Specimen sampling during testing function |
Recommended products for customers viewing this product
- Contact us
- Customer Support Desk
Measurement & Evaluation Systems / Semiconductor-related Equipment
-
Measurement & Evaluation Systems
- Electro-chemical Migration Evaluation System(Leakage Current Evaluation System)
- High Voltage Bias Insulation Resistance Evaluation System
- Capacitor Leakage Test System
- High Temperature Reverse Bias Test System
- TDDB (Time-Dependent Dielectric Breakdown) Evaluation System
- Conductor Resistance Evaluation System
- Electromigration Evaluation System
- PV Thermal-Bias Combo Test System
- Semiconductor Parametric Test System
- Capacitor / Inductor Temperature Characteristic Evaluation System
- PV I-V Evaluation System (PV Thermal-Light Combo Test System)
- Power Cycle Test System
- Semiconductor-related Equipment




