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Capacitor Leakage Test System

Electronic parts that support compact, high-performance electronic devices. As the structure of electronic parts continues to become more dense and complicated, it is also decreasing in size, and there is active development of parts that are compact, high capacity, environmentally friendly and with lower ESR. Among these, condensers are essential key devices for the innovation of laptops, cell phones, mobile devices, and Bluetooth and other multimedia devices. Reliability testing to ensure the performance and safety of these will be even more important in the future. ESPEC has developed the Capacitor Leakage Test System that enables automatic evaluation of insulation degradation characteristics of condensers in high temperature and high temperature/humidity test environments. This system applies voltage to the condenser in the desired high temperature (humidity) test environment and obtains the leak current caused by insulation breakdown.
This automatic measurement system comes with various data processing and analysis functions, including display of leak current caused by insulation breakdown, failure detection and calculation, and failure analysis using cumulative hazards.

Overview of Equipment

Features
  • Automatic evaluation of insulation degradation characteristics of condensers in high temperature and high temperature/humidity environments.
  • Standard 500 channels, and can be expanded to a maximum 1,000 channels.
  • Measurement can be performed with an insulation resistance range of 10 kΩ to 100 MΩ.
  • Set test conditions in units of 25 channels. (The applied voltage value is for every 100 channels.)
  • Display and check the temperature and humidity of the hot chamber, number of failure occurrences, and section failure rate in real-time.
  • Evaluate the insulation degradation characteristics from the histogram of the number of failure occurrences, the failure rate curve, and data analysis using the cumulative hazards.
  • Supports various condenser mounting jigs, including board mounting and contact probe types.
Features
  • Insulation degradation testing of ceramic chip condensers and other condensers

システムブロック図

Detailed Specifications

Please scroll horizontally to look at table below.

Number of channels Standard 500 channels, and can be expanded to a maximum 1000 channels
Software Operating system Windows 7
Instrumentation control Stress voltage application range 1.0 to 100 V DC (can be changed in 0.1 V increments up to 50 V and 1 V increments above 50 V)
Power supply capacity 100 V, 3 A (1 power supply mounted per 100 channels), in series with a condenser per channel
When a protective resistor 10 kΩ is connected
Resistance measurement range 10kΩ to 100MΩ (at DC1V to 100V)
Measurement speed 3 sec. or less per channel (varies depending on condenser capacity)
Test condition setting unit Units of 25 channels. Select test channel in 1-channel units. Applied voltage is in units of 100 channels.
Control unit 500 channels
Fault determination standard
(4 types)
1. Insulation resistance limit 1 (insulation resistance value, test stop), 2. Insulation resistance limit 2 (insulation resistance value, failure display only), 3. Change value limit (change value from initial value, test stop), 4. Change rate limit (change rate from initial value, test stop); Test stop is only for the channel where the failure occurred.
Test condition setting unit 1. Cancel: Cancels all test channels (automatic control to specified temperature and humidity), 2. Forced termination: Select to end testing on all channels or a desired channel
Data processing Operation status display Test temperature/humidity, remaining number of samples, number of failures, total/section failure rate, test conditions, available disk space, resistance value by test unit/channel, and failure status
Graph display Graph display of test unit units (25 channels) and insulation resistance value per channel
Data display and data conversion Display of failures by test unit units, display of insulation resistance value per channel, text data and secondary data conversion (for data analysis software) function
Data analysis Histogram Histogram of number of failures by test time, X axis: time divided by segment, Y axis: number of failures
Failure rate curve Failure rate graph by test time, X axis: test time, Y axis: failure rate by measurement time
Weibull analysis Weibull plot and parameter estimate calculation of m, η, γ, MTTF, δ, and median
Failure data Select by insulation resistance limit 1, insulation resistance limit 2, change value limit, and change rate limit
Data analysis Valid only after test is complete
Sample mounting jig Test substrate mounting type, contact pin type, etc.
Hot chamber High temperature & humidity chamber or hot chamber
Utility requirements (excluding chamber) AC100V 1φ15A、AC200V 1φ30A
  • * The contents herein are subject to change without notice.
  • * Windows is a registered trademark of Microsoft Corporation in the United States.

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