Rapid-Rate Thermal Cycle Chamber

New
TCC-151W-20 High performance model
with 20K/min for JEDEC/IPC (1.0MB)

R-449A

Overview of Equipment

High temperature rate of change with uniformity and reproducibility

This thermal cycle chamber can be rapidly changed air temperature while controlling specimen temperature for the way such as JEDEC standard and screening.

Specifications

Please scroll horizontally to look at table below.

Model	Temperature range	Performance			Inside/Outside dimensions (mm)
Model	Temperature range	Ramp control	Specimen	Temperature rate of change	Inside/Outside dimensions (mm)
TCC-151W	ー70℃～+180℃	ON	(glass epoxy PCB) 5kg ＋ Jig: 4kg	15K/min	W800×H500×D400/ Ｗ1000×H1808×D1915
TCC-151W-20	ー70℃～+180℃	ON	(glass epoxy PCB) 5kg ＋ Jig: 4kg	20K/min	W800×H500×D400/ Ｗ1000×H1808×D1913
TCC-301W-10	ー70℃～+180℃	ON	(glass epoxy PCB) 10kg ＋ Jig: 8kg	10K/min	W800×H500×D750/ Ｗ1000×H1808×D2265

Test Standard Conformance: JESD22-A104
JESD22-A105
IEC 60749-25
IEC 60068-2-14 Nb（JIS C 60068-2-14 Nb）
IEC-61747-5（EIAJ ED-2531B）
IPC-9701
IPC-TM-650 2.6.6
AEC-Q100
LV 124 L-03
SAE-J1211

Features

Fatigue life is affected by strain rate and waveform.
In thermal cycle chambers, the strain rate depends on the temperature change rate, while waveform symmetry is influenced by the balance of heating and cooling.

Highly reproducible ramp control

Our TCC ramp control ensures symmetrical strain waveforms and maintains constant strain rates across different sample sizes, delivering exceptionally reproducible test results.

Meet JESD22-A104

Standard tests that require specimen temperature ramp rates of 15K/min or less (−40℃ to + 125℃) can be carried out with ease and accuracy.

Maximized temperature uniformity for equal thermal load to the specimen

Selection of the temperature control mode

Two temperature control modes are available:

A specimen temperature control mode meeting ramp rate conditions of JEDEC standard
An air temperature control mode for temperature cycle tests.

Free access

Cable ports are equipped on both left and right side, to ease specimen access and wiring.

Ramp rate input available(Japanese patent No. 6784649 and No.6948448)

The step time can be calculated automatically just by inputting the ramp rate.

Multilingual support

The display supports English, Simplified Chinese Traditional Chinese, Korean or Japanese, making it accessible to a wider range of operators.

Email alert

Sends out E-mail alerts for test finish, recommended maintenance timing and alarm notification.

Example of TCC-151W