Large Highly Accelerated Stress Test System (HAST Chamber) | Environmental Test Chambers | Products | Products & Services

Large Highly Accelerated Stress Test System
(HAST Chamber)

Overview

As electronic components become more densely integrated, the demand for Highly Accelerated Stress Test (HAST) Systems is increasing. Our HAST system provides bias testing with terminals for applying constant voltage and signal inputs.
We offer the M-type model with three temperature/humidity control modes: Unsaturated Control, Wet-Saturated Control (standard), and Dry/Wet-Bulb Temperature Control (optional).
This chamber supports pressure cooker testing in accordance with IEC 60068-2-66.

Features

Shorter test time compared to humidity test under atmospheric pressure.
Depth-extended model is also available for larger specimen size or increased lot sizes.
Standard mechanical door lock with door lock safety function.

Applicable standards

Please scroll horizontally to look at table below.

	Test Standard	Test Specimens	Control Type
For semiconductors^*1	IEC 60068-2-66	Compact electrical and electronic components (mainly non-hermetically sealed components)	Unsaturated
	IEC 60749-4	Semiconductor devices	Unsaturated
	JEITA(EIAJ) ED-4701	Semiconductor devices	Unsaturated
	JESD22-A110E	Non-hermetically sealed (not hollow) device	Unsaturated
	JESD22-A102E	Non-hermetically sealed IC discrete device	Saturated
Other test standards	JIS C 60068-2-66	Aluminum metal corrosion of integrated circuits and semiconductor devices	Unsaturated
Other test standards	JPCA-ET08-2002	Printed circuit boards	Unsaturated

*1: M-type is the only model to perform these testing standards.

Specifications

Please scroll horizontally to look at table below.

	Model	EHS-432(M) *(M) Type dry & wet-bulb temperature control	EHS-432(M)-L L： Long-type Chamber
Dimensions	Test area capacity	130L	180L
	Test chamber internal dimensions	φ548mm×L560mm	φ548mm×L760mm
	External dimensions (W×H×D)	W800×H1575×D1260 mm	W800×H1575×D1460 mm
Performance	Unsaturated control	Temperature control range 105.0 - 162.2°C
		Humidity control range 75 - 100%rh
		Pressure range 0.0196 - 0.392MPa（Gauge）
		Heating and pressurization time (at RT.23°C): approximately 90 minutes	Heating and pressurization time (at RT.23°C): approximately 120 minutes
	Wet-saturated control	Temperature control range 105.0 - 151.1°C
		Pressure range 0.0196 - 0.392MPa（Gauge）
		Heating and pressurization time (at RT.23°C): approximately 90 minutes	Heating and pressurization time (at RT.23°C): approximately 120 minutes
	Dry & wet-bulb temperature control (M type)	Temperature control range 105.0 - 162.2°C
		Humidity control range 75 - 95%rh
		Pressure range 0.0196 - 0.392MPa（Gauge）
		Heating and pressurization time (at RT.23°C): approximately 120 minutes	Heating and pressurization time (at RT.23°C): approximately 150 minutes

Remarks:: Please note that when exporting the chamber overseas, the pressure vessel may be subject to restrictions due to the applicable standards. Please contact for further details.

*Please contact us for the wide-range HAST test, Whisker Acceleration Test and Air-HAST test.
*We can tailor specimen power supply terminal as per clients' request. Please contact us for more info.
*Please contact us for high-voltage specification which requires special design due to the cause of internal discharge.

Test examples

Wire bonding conduction evaluation	Specimen: Semiconductor packages Test conditions: 130°C/85%rh 100h
LED humidity degradation evaluation	Specimen: LED Test conditions: 105°C/87%rh 250h
Whisker evaluation	Specimen: Printed board Test conditions: 120°C/85%rh 2500h
Migration evaluation	Specimen: Printed board Test conditions: 110°C/85%rh 100h, 130°C/85%rh 400h

Specimen examples: ・Semiconductor packages; ・PCBs