Highly Accelerated Stress Test System (HAST Chamber)

Overview of Equipment
Test Fixture Solutions
Deeper Model for Large PCBS/High-Volume
Air-HAST

Overview of Equipment

The Highly Accelerated Stress Test Chamber has been primarily developed to conduct bias testing which applies constant voltage and signals. The standard equipment features two control modes: [unsaturated control] and [wet saturated control], while the M-type chamber additionally offers a [wet and dry bulb temperature control] mode.
The M-type chamber conforms to the IEC60068-2-66 standard.

Optimized Strength & Maximum Test Area
Prevention of dew condensation and wetting of specimens
Air-circulating fan for high-accuracy testing
Expandable Up to 72 Pins – Color-Coded Terminals for Easy & Accurate Wiring.
Reliable Protection & Control – Ensuring Safe Power Supply to Specimens.

Specifications

Please scroll horizontally to look at table below.

Model	Temperature, humidity and pressure range	Inside/Outside dimensions(mm)
EHS-212	＋105.0 to ＋142.9℃ / 75 to 100％rh / 0.020 to 0.196MPa（Gauge）	φ294×D318 / W640×H1483×D850
EHS-212M		φ294×D318 / W640×H1483×D850
EHS-212MD		φ294×D318×2 / W760×H1796×D1000
EHS-222		φ394×D426 / W740×H1553×D1000
EHS-222M		φ394×D426 / W740×H1553×D1000
EHS-222MD		φ394×D426×2 / W860×H1796×D1000
EHS-412	＋105.0 to ＋162.2℃ / 75 to 100％rh / 0.020 to 0.392MPa（Gauge）	φ294×D318 / W640×H1483×D850
EHS-412M		φ294×D318 / W640×H1483×D850
EHS-412MD		φ294×D318×2 / W760×H1796×D1000

Test Fixture Solutions

In HAST testing,fixtures that ensure stable application of voltages and currents even in hih-humidity environments are essential. Defects in the fixtures may lead to retesting and unnecessary costs. Leveraging our extensive expertise, we provide dedicated fixtures optimized for each sample to provide stable test environments and higly reliable evaluation results.

Fixtures for boards
(Card edge type)
Fixtures for boards
(Insert type)
Fixtures for capacitors
(Probe type)
Fixtures for capacitors
(Chip-clip type)
Fixtures for wafer chips

Deeper Model for Large PCBS/High-Volume

This model is capable of simultaneous testing of several large PCBs,such as multilayer PCBs used for motherboards, or batches of many specimens. Statistically reliable data can be obtained more rapidly, which leads to faster test cycles.
This can help reduce both development time and testing costs, for more efficient product development.

Improved Testing Efficiency

Image of internal chamber size comparison
120-pin configuration example

Expanded dept: Expanded 200mm compared with the 51l model(EHS-222M)▶Internal dimensions:
φ394㎜×D626㎜
Supports large boards: Accommodates boards up to approximately 470mm×290㎜,offering flexibility for wide range of specimen sizes.
High-voltage/multi-pin support: Enables energized testing up to 1000V1A×120pins.

Improved Work Efficiency

As pin count increases, wiring becomes more complex. Connector-block fixtures simplify the process for improved work efficiency and more stable test environments.

Air-HAST

Reproduction of near-constant temperature and humidity
testing environment with Air-HAST (option for M/MD type only)

Depending on the specimen, not only water steam but also oxidation and other specimen surface conditions can cause failure.
By leaving air in the test area, the Air-HAST function adds air to the high-temp, highhumidity, and pressurized environment for effective accelerated testing of specimens for which the oxygen in air affects degradation, such as with surface oxidation. (Acceleration may not be seen for some specimen.)

Whisker humidity-resistance evaluation testing (Japanese patent No. 5066143): Evaluation examples for whisker evaluations of mounting boards are limited. One of the main reasons for this is because the testing time can be as long as 1000 or 3000 hours.
To shorten these testing times, ESPEC conducts lead-free solder whisker evaluation of mounting boards using Air-HAST. The results confirmed accelerated effects with testing at 85°C and 85%rh humidity.

Please scroll horizontally to look at table below.

Accelerated testing examples for whisker evaluation
Temperature cycling test	-40°C ↔ +85°C	3000 cycles
High temperature and high humidity test	+55°C / +85%rh	3000 hours
High temperature and high humidity test	+85°C / +85%rh	1000 hours
Air-HAST	+110°C / +85%rh	200 hours