In July 2026, ESPEC CORP. (Head Office: Kita-ku, Osaka; President and Representative Director: Satoshi Arata) launched the AMI-SPM Low-Voltage Insulation Reliability Evaluation System, a reliability evaluation system for detecting minute insulation degradation with high accuracy at low voltages. The system supports insulation resistance and leakage current measurement in advanced package development and helps evaluate the insulation reliability of new materials and structures.

With the widespread adoption of generative AI and the increasing sophistication of electronic devices, demand is growing for higher speed, higher-density semiconductor packages. To meet these requirements, advanced packages increasingly feature finer wiring, new insulation materials, and more complex structures. As a result, insulation degradation, which is a sign of insulation failure, also becomes extremely subtle, requiring higher-accuracy resistance measurement.

The AMI-SPM Low-Voltage Insulation Reliability Evaluation System is designed to apply low voltages of 10 V or less used in advanced packages and evaluate insulation degradation occurring in the low-voltage range. It enables high-accuracy detection of minute signs of insulation degradation occurring under low-voltage stress close to actual operating conditions and supports insulation reliability evaluation of fine wiring, new insulation materials, and packages with new structures. In addition to improving resistance measurement accuracy, a Weibull analysis function has been added to help improve testing efficiency.
ESPEC has also launched the AMR-SPM Low-Current Conductor Reliability Evaluation System, which detects minute resistance fluctuations at low currents.

ESPEC will continue expanding its products and services for the AI semiconductor market, where technological innovation is advancing, to help to improve reliability and solve technical challenges.

• AMI-SPM
  Low-Voltage Insulation Reliability Evaluation System
• 

Features of the AMI-SPM Low-Voltage Insulation Reliability Evaluation System

1. Insulation degradation (leakage current) evaluation system specialized for low voltages
   The AMI-SPM is an evaluation system designed to apply low voltages of 10 V or less used in advanced packages and evaluate insulation degradation occurring in the low-voltage range.
   It enables high-accuracy detection of minute signs of insulation degradation occurring under low-voltage stress and supports insulation reliability evaluation of fine wiring, new insulation materials, and packages with new structures.
   
2. More efficient accelerated evaluation through integration with the Highly Accelerated Stress Test System (HAST Chamber)
   In advanced package development, there is growing demand for reliability evaluation using accelerated tests such as b-HAST to shorten evaluation periods and enable earlier assessment. With its high measurement accuracy and resolution, the AMI-SPM detects minute leakage currents and changes in resistance occurring during accelerated tests. This enables capturing degradation before dielectric breakdown occurs. Furthermore, linkage with the Highly Accelerated Stress Test System (HAST Chamber) has been enhanced to automate the entire sequence of operations from test start to completion to improve ease of operation.
3. Newly developed software enabling Weibull analysis during testing
   The system comes standard with statistical processing software that incorporates measurement data in real time during testing and enables Weibull analysis and other statistical analyses. Previously, measurement data had to be retrieved after testing and processed separately for statistical analysis. This software enables prompt analysis while checking data trends during testing. By reducing the analysis workload after testing and supporting earlier assessment of evaluation results, the software helps shorten development cycles.
   Real-time data updates during testing

Specifications

*Preliminary specifications. Specifications are subject to change without notice.