Examples

• Electrical Conduction Reliability Evaluation Systems (Electro-Migration Evaluation Systems)
  • Performs evaluations by accelerating electrical conduction failures due to thermal warping with the application of a constant current under high temperature and measuring the change in resistance.
  • Saves labor by automatically displaying graphs using the analysis software.
  • Applies stress current to specimens by working in conjunction with the temperature chamber and measures resistance.
  • Saves labor in tests by simultaneously measuring a maximum of 240 channels.

  Model	AEM
  Number of measurement channels	maximum of 240 channels
  Stress current source output range	＋DC0.1～200mA * Contact ESPEC regarding the current range.
  Supported ESPEC temperature chambers	AEM dedicated high-accuracy temperature chamber (Temperature range +65 to +350°C)

  

  
• Electrical Conduction Reliability Evaluation Systems (Conductor Resistance Evaluation System)
  • Evaluates electrical conduction failures by accelerating repeated thermal expansion and contraction with rapid temperatures changes and measuring the change in resistance.
  • Automates failure judgments, such as due to cracks, with the continuous resistance measurement and judgment function during testing.
  • Saves labor by simultaneously monitoring and recording temperature in conjunction with the environmental test chamber.
  • Saves labor in tests by simultaneously measuring a maximum of 280 channels.

  Model	AMR-U
  Number of measurement channels	280 channels/rack maximum
  Current application method	Direct electric current measurement method
  Resistance measurement range	1×103〜1×106Ω
  Supported ESPEC temperature chambers	Air to Air Thermal Shock Chambers TSA Series Air to Air Thermal Shock Chambers TSD Series Rapid-Rate Thermal Cycle Chamber TCC

  

  
• Optimal Chambers for Electrical Conduction Reliability Evaluations

  <Air to Air Thermal Shock Chambers Fixed test area type>

  • A static test area for easy specimen accessibility.
  • A rich lineup that allows you to select a chamber size according to the number and size of specimens.
  • A door notch (option) is available that can help simplify the work to wire specimens.

  <Air to Air Thermal Shock Chambers Elevator type>

  • A test area with an elevator mechanism that is a perfect fit for Japanese and international standards, such as MIL, IEC, and JASO.
  • A rich lineup that allows you to select a chamber size according to the number and size of specimens.
  • Simplifies wiring with a cable port installed on the right side of the chamber.

  <Rapid-Rate Thermal Cycle Chamber>

  • Supports rapid temperature change tests with a temperature rate of change of a maximum of 23°C/min.
  • Dual-side wiring for greater efficiency.
  • Internal chamber temperature differences are minimized to evenly apply temperature load to specimens.

  

  

  Product name	Air to Air Thermal Shock Chambers Fixed test area type	Air to Air Thermal Shock Chambers Elevator type	Rapid-Rate Thermal Cycle Chamber
  Model	TSA	TSD/TSE	TCC-151-W
  Product appearance
  Inside capacity	40～300L	10～300L	160L
  Temperature range	EL type High temperature side ambient temperature +50 to 200°C Low temperature side -65 to 0°C ES / EH type High temperature side +70 to 200°C Low temperature side -70 to 0°C	High temperature side +60 to 205°C High temperature side +60 to 205°C	-70～＋180℃