Examples

• Permittivity Temperature Dependency Evaluation Test System - Spot Cooling and Heating System + Radio Wave Transmission Box <S-Parameter Method (Free Space Method)>
  • This system can conduct tests with the antenna at ambient temperature because it controls the temperature around the specimen only.
  • Temperature can be changed rapidly by blowing temperature controlled air directly on the specimen.

  Model	MTA-170 * A compressed air source is required.
  Temperature range	−60 to +200 °C (Controllable temperature range)
  Temperature Change Rate	Heat-up rate 10 °C/min Cool-down rate 10°C/min *Temperature range -29 to +169°C
  Dew-point temperature	-60 °C or less
  Compressed air flow rate	140～200NL / min
  Compressed air pressure	0.55～1.0MPa

  
• Permittivity Temperature Dependency Evaluation Test System - Bench-Top Type Temperature (& Humidity) Chamber<Split Cylinder Method>
  • Split cylinder resonators in which specimens have been set can be installed in the test area as units to build a testing environment that saves space.
  • Select the type with humidity control for specimens that are affected by humidity to be able to conduct permittivity measurements in a temperature and humidity environment.

  Model	SH／SU-262　　SH／SU-662
  Temperature range	-60 to +150 °C (Controllable temperature range)
  Temperature Change Rate	Heat-up rate 2.9 °C/min, Cool-down rate 1.7°C/min (Temperature range -39 to +129 °C) * Reference values

  

Examples

• Insulation Reliability Evaluation Test Systems　Insulation Resistance/Leakage Current Evaluation System
  • Evaluates insulation degradation by accelerating insulation failures with the application of power in a high temperature and high humidity environment and measuring the change in resistance.
  • Automates tests by automatically detecting (leak touch detection judgment) short circuits that occur instantaneously and repeated short circuit/recovery.
  • Works in conjunction with the temperature chamber and automatically measures at the preset conditions.
  • Automates measurements of multiple specimens with our proprietary scanner method.

  Model	AMI-U
  Number of measurement channels	150 channels/rack(100V/300V/500V/1000V/2500V) 300 channels/rack(100V/300V/500V) * Expandable as a custom option.
  Measurement range	2×105～1×1013Ω(When 100 V is applied) 2×103~1×1011Ω(When 1 V is applied)
  Voltage application range	100V／300V／500V／1000V／2500V
  Supported ESPEC temperature chambers	• Highly Accelerated Stress Test System - HAST Chamber • Platinous J Series Temperature & Humidity Chamber ・High-Power Temperature & Humidity Chamber AR Series • Bench-Top Type Temperature (& Humidity) Chamber

  

  
• Insulation Reliability Evaluation Test Systems　Highly Accelerated Stress Test System - HAST Chamber
  • Stacked chambers save space.
  • Top and bottom chambers can be set with different temperature and humidity conditions (EHS-212MD/222MD/412MD).
  • A sliding shelf terminal board is available as an option that can be wired outside the chamber and then installed in the test area. This simplifies the work required to wire specimens.
  • Large types are available that are perfect for evaluating large specimens or large amounts of small specimens.

  

  Model	EHS-212／222／412（M／MD）	EHS-432／432L
  Temperature & humidity range	212／222 Temperature　+105 to +142.9°C Humidity　75 to 100%rh 412 Temperature　+105 to +162.2°C Humidity　75 to 100%rh	Humidity　75 to 100%rh Humidity　75 to 100%rh
  Interior dimensions	212／412 Φ294×D318　*(296)mm 222 Φ394×D426　*(404)mm * Dimensions in parentheses () exclude fan guard projection.	432 Φ548×D560 mm 432-L Φ560×D760 mm