Select Products
from Devices
- Base Stations
- Devices and Communications Modules
- Servers and Server-Related Modules
- Antennas
- Optical Transmission Devices
- Passive Components
- Wire Materials for Millimeter Wave-Compatible Boards
- Board Resin Materials Compatible with Millimeter Waves
Base Stations
Proposing Test Areas and Temperature Chambers Supporting High Heat-Generation Loads and Temperature Dependency Evaluation in OTA Measurements
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Devices and Communications Modules
Proposing Optimal Test Areas for Temperature Characteristics Evaluations, Transportation Evaluation Tests, and Temperature Cycle Tests of 5G Communications Devices (High Frequency Signals)
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Servers and Server-Related Modules
Proposing Dedicated Devices for High Heat-Generation Load, High Temperature/Low Temperature Reliability Tests in the Evaluation of Server Performance
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Antennas
Proposing Optimal Test Areas and Temperature Chambers for Reliability Evaluations and Temperature Dependency Evaluation in OTA Measurements
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Optical Transmission Devices
Proposing Optimal Test Areas for Reliability Evaluations (Telcordia Standards) and Temperature Dependency Evaluations
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Passive Components
(Capacitors, Inductors, and Other Components)
Proposing Optimal Test Environments for Saving Labor in and Automating Reliability Evaluations and Temperature Characteristics Evaluations
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Select Products from Test Names
- For Base Stations
Systems for OTA Tests/Wireless Tests in Temperature Environments - High Temperature/Low Temperature Reliability/Operation Tests for Base Stations
- High Temperature/Low Temperature Reliability/Operation Tests for 5G Communications Devices
- Transportation Evaluation Tests
- Thermal Cycle Tests
- High Temperature/Low Temperature Reliability/Operation Tests for Servers
- For OTA Tests/Wireless Tests in Temperature Environments for Antennas
- Insulation Reliability Evaluation Tests
- Inductivity Temperature Dependency Evaluation Tests
- Electrical Conduction Reliability Evaluation Tests
- Reliability Evaluation Tests
- Temperature Characteristics Tests
- High Frequency Inductor/Capacitor
Temperature Characteristics Evaluation Tests - Multi-Layered Chip Inductor
Reliability Evaluation Tests - Capacitor Insulation Degradation Evaluation Tests
Select Products from Test Issues
-
Higher Heat Generation from Devices
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OTA Tests/Wireless Tests in High/Low Temperature Environments
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Temperature Characteristics Tests of Optical Devices and High Frequency Devices
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EMC Countermeasures during Environmental Tests
Consult with Our Dedicated 5G/IoT Advisors
We can help you work through issues related to testing.
- I want to conduct RF characteristics tests and protocol tests for communications modules and antennas in a temperature environment.
- I want to automate temperature characteristics evaluations of passive components.
- I want to conduct temperature characteristics tests of materials that allow the transmission of radio waves and shield materials, such as radomes.
- I’m looking for a temperature chamber that is suitable for the heat generation of my test sample.
- I want to block radio waves that are generated from the sample during testing.
- I’m looking for a system that can perform testing that meets Telcordia GR-468 standards.
- I want to evaluate electrical conduction failures due to thermal expansion and contraction.
- I want to evaluate usage at high altitudes and durability in reduced pressure environments, such as those during transport.