The Rapid-Rate Thermal Cycle Chamber is ideal for test requiring quick changes in specimen temperature, and covers various applications from JEDEC, IEC standards to screening.
It features new technologies, such as a specimen temperature control function maintaining linear specimen temperature change rates during rapid thermal cycling, and temperature ramp control.

IEC-60749-25 : Semiconductor devices – Temperature cycling

IEC-60068-2-14 Nb : Environmental testing – Change of temperature

IEC-61147-5 : Liquid crystal and solid-state display devices – Environmental, endurance and mechanical test methods

JESD22-A105-B : Solid State Devices, testing quality and reliability – Power and temperature cycling

SAE-J1211 : Automotive components - Recommended environmental practices for electronic equipment design

IPC-9701 : Performance test methods and qualification requirements for surface mount solder attachments