半導体関連試験装置ラインアップ 英語


>> P.5

ModificationofEnvironmentalTestChamberforSemiconductormarketDoorNotchandSlidingShelf●Easytoinstallheavyobjects●Simplewiringworkhttps://espec.satori.site/english/products/catalog/usability#sec2SlideDoor●Simplewiringwork●DemonstrationtestprovidedApplicableSeriesPlatinousJSeriesandARSeriesSpecimen(acarnavigationsystem,etc.)SlitDoornotchPowersupply,etc.RubberplugfordoornotchDoornotchDimensions:H100×D50mm*IncludingdedicatedrubberplugSlidingshelfLoadcapacity:Maximumloadcapacity100kgSlidelength:Approx.700mmApplicableSeriesBench-TopTypeTemperature(&Humidity)Chamberhttps://espec.satori.site/products/catalog/usability#sec6(Japaneseonly)FlatcableporttypeSampleholdertypeRectangularCablePortSimplelargeconnectorwiringworkApplicableSeriesThermalShockChamberTSASeries65mm125mmhttps://espec.satori.site/products/catalog/usability#sec4(Japaneseonly)Dimensions:H125×D65mmMax.numberofports:Maximum2onleftsidewallMaximum1onrightsidewallRemovableTerminalBlocksSlidingPanel-MountedTerminalBlocksApplicableSeriesHASTChamberSimplewiring+simpleinstallation=reducedworktimehttps://www.espec.co.jp/english/products/book/hast/#target/page_no=13Terminalblockallows12-pinspecimensignalterminalsinthetestareatobeinsertedandremovedatonceTerminalblockthatslidestothefront


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