>> P.5
ElectrochemicalMigrationEvaluationMeasurementresultsusingAMIDeteriorationofinsulationresistanceunderhightemperatureandhighhumidityconditions(Circuitboardsurface)Deteriorationofinsulationresistanceunderhightemperatureandhighhumidityconditions(Circuitboardsurface)1.00E+13SampleASampleBSampleCSampleASampleBSampleCRecoversafterinsulationdecreaseRecoversafterinsulationdecreasePracticallynochangesPracticallynochangesDetectsinstantdropinresistance.Detectsinstantdropinresistance.Suddenlydecreasestolessthan1MΩSuddenlydecreasestolessthan1MΩ332352312312332352372372272272292292100100112112132132152152172172192192232212Testduration(hr)212Testduration(hr)232252252TestconditionsTestconditions*DataprocessedwithExcel(spreadsheetsoftware).*DataprocessedwithExcel(spreadsheetsoftware).TemperatureandhumidityconditionStressvoltageTemperatureandhumidityconditionMeasurementvoltageStressvoltageMeasurementintervalsMeasurementvoltageMeasurementintervals:40℃,90%rh:50VDC:40℃,90%rh:50VDC:50VDC:0.5h:50VDC:0.5h1.00E+131.00E+121.00E+121.00E+111.00E+111.00E+101.00E+101.00E+091.00E+091.00E+081.00E+081.00E+071.00E+061.00E+071.00E+06Resistancevalue(Ω)ResistanclueΩ)Weibullanalysis(option)Lifetimeevaluation(samesample,samevoltage)Lifetimeevaluation(samesample,samevoltage)Inthegraphbelow,theangleoftheredlineisverydifferentfromtherest,showingthatitsInthegraphbelow,theangleoftheredlineisconditions(120°Cand85%rh)areasevereverydifferentfromtherest,showingthatitsenvironment.conditions(120°Cand85%rh)areasevereenvironment.ThisisaWeibullplotthatisusedinlifetimereliabilityanalysis.AMIisequippedwithasupporttoolforcreatingWeibullplotsthatarehelpfulforlifetimeanalysis.4
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