HTOL / LTOT Chambers For Electronic Devices
Radio frequency compatible electronic devices (passive elements, SAW, LCR, RF amplifiers, etc.) are used in base stations and servers for 5th generation mobile communication systems (5G).
Since heat load is generated due to an increase in the amount of information processing and a high density of mounting, it is necessary to evaluate the reliability and temperature characteristics of the device itself. This is to introduce a constant temperature chambers that enables evaluation in a stable temperature environment
Shield chambers For Base station / 5G terminal / Electronic device
Demand for various communication devices in the frequency band, which corresponds to ""Sub6"" for 5th generation mobile communication systems (5G), is increasing and being evaluated. It is necessary to suppress the influence on peripheral devices.
This is to introduce a shield chambers that blocks external radio waves and makes it possible to realize a temperature environment without leaking internal radio waves to the outside.
For electronic devices and substrate
JEDEC/IPC standard temperature cycle test chambers
5th generation mobile communication systems (5G) makes faster communications and lower latency.
As a result, it is required to be used not only in conventional smartphones but also in a wide range of fields such as transportation, medical care, and disaster prevention.
On the other hand, further safety and reliability tests are essential because equipment failure threaten person injured and huge economic losses.
For this reason, the demands for reliability tests based on the JEDEC standard and IPC standard is increasing, and we introduce a dedicated chambers that supports the temperature change rate required by the standard.