>> P.4
FeaturesExampleofAMQconnectedwithaCompactultralowtemperaturechamberDedicatedjigsforSMDcomponents(option)Applications●Capacitors●Electrostaticcapacity(C)●Lossfactor(D)●Temperaturecharacteristicsofimpedance(Z)●Frequencycharacteristics3●Electronicmaterials●Printedboards●Flux●Insulationmaterials(resin,film,etc.)●Dielectricmaterials(titanium,ceramic,tantalum,aluminumelectrolyticmaterials,etc.)Thissystemcanbeusedtoevaluatetheelectrostaticcapacity(C),lossfactor(D),andimpedance(Z)ofcapacitorsandvariousmaterialsinaspecifictemperatureenvironment.Automaticmeasurementofupto64channelsThesystemcanmeasuremultiplechannelsofelectrostaticcapacity(C),lossfactor(D),andimpedance(Z)indifferenttemperatureenvironments.Youcanselectthenumberofchannelsinto64channels.themultipleofeight,upThegraphfunctionallowsforreal-timereviewofmeasurementresultsCollecteddata,includingthevaluesofelectricalcharacteristicsandrateofchangeatdifferenttemperatures,frequencies,andtime,canbereviewedinrealtimethroughavarietyofgraphfunctions.Selectablefromdifferenttestmodestestmodesareavailable:Threetemperaturecharacteristicevaluationtest,constantoperationtest,andfrequencycharacteristicstest.<Temperaturecharacteristicevaluationtest>Inthistestmode,characteristicdataisautomaticallyrecordedandsynchronizedwithchangesintemperatureupto40steps.<Constantoperationtest>Thistestmodemeasureschangesincharacteristicsovertimeinaspecifictemperatureandautomaticallyrecordsdata.ronmentenvi<Frequencycharacteristicevaluationtest>Thistestmodeautomaticallyrecordscharacteristicdataatvariousfrequencieswhilechanginginaspecifictemperatureenvironment.Testingcanbecombinedwithatemperaturecharacteristicevaluationtestorconstantoperationtest.thefrequency
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