>> P.2
Electromigrationevaluationat350°CAstheminiaturizationofsemiconductordevicesprogresses,evaluatingelectromigrationunderexcessivelysevereconditionsisbecomingessential.TheAEMSeriesElectro-MigrationEvaluationSystemoffersaccuratemeasurementsbasedontemperatureandcurrentstress—twomajorfactorsaffectingadevice’sservicelife—andanalysissoftwarefordeterminingthenecessaryparametersforjudgingthelifeofadevice.Designedtomeetawiderangeofevaluationneeds,fromcutting-edgeevaluationstoproductionmanagement,theAEMSeriesoffersenhancedoperability,superiorreliability,andsimplifieddataanalysis.1
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