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13 (02.3.15)
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Latest trends in wafer level burn-in systems. |
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Abstract
Wafer Level Burn-In (WLBI) has been an extremely effective measure for
guaranteeing Known Good Die (KGD) and reducing ever-expanding testing costs.
The industry has very high interest in the method. This article will discuss the latest
trends in wafer level burn-in and look at newly-developed equipment capable of
simultaneously burning in 256 die, four times the previous processing capacity. |
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6 (98.9.30)
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Wafer Burn-in system |
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Abstract
Wafer burn-in is attracting attention as the most effective measure for reducing
burn-in*1 cost and obtaining KGD*2 (Known Good Die) in semiconductor
production. In this article I would like to discuss the merits and major themes of wafer
burn-in, and present the wafer burn-in system developed by Tabai Espec. |
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