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15 (03.4.1)
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Nonvolatile memory: trends and evaluation equipment |
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Abstract
Portable data terminals are currently seeing a rapid surge in applications for
such areas as PDAs (Personal Digital Assistants), and are also being used in
expanding the data infrastructure. These trends are fueling competition among
semiconductor manufacturers. Nonvolatile memory, which is capable of
retaining data in memory when the power has been shut off, is generating
particularly strong interest, and a wide range of nonvolatile memory is being
developed. Requirements for equipment to test nonvolatile memory include
high throughput speed and highly flexible evaluation functions. Espec produces
a full line-up of test and inspection equipment for nonvolatile memory to meet
the entire gamut of customer needs, from research and development through
mass production. I would like to take this opportunity to introduce our line-up. |
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14 (02.9.15)
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Magnetic characteristics evaluation system for GMR heads |
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Abstract
Retrieving data from high-density
points requires high sensitivity, which GMR heads, unlike conventional MR heads, attain
mainly through the use of spin-valve structure. However, ensuring heat resistance with
spin-valve GMR heads can be problematic, and the head manufacturers are seeking for
improvements by developing superior heat resistant heads. As hard disk memory density
is now increasing in extremely short cycles, the problem facing manufacturers is to
somehow evaluate new devices quickly. |
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8 (99.9.30)
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Evaluation validity in systems with continuous, automatic measurement |
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Abstract
We at Tabai Espec are incorporating measurement
of electrical characteristics in our environmental
test equipment. This arrangement enables us to continually
measure specimen characteristics under environmental
conditions, and thus grasp real time characteristics
when determining malfunction modes. We are currently
developing a full line of automatic measuring systems.
This report will introduce some aspects of evaluation
systems and discuss the effectiveness of automatic
measurement systems. |
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