3-2 Chemical
kinetics model
This model
is based on the chemical reactions between
the molecules of matter within a solid, and
utilizes the principle that the existence
of background heat strongly influences the
initiation and the progress of the reaction.
For example, when hydrogen and oxygen react
to form water, the higher the temperature,
the greater the speed of the chemical reaction.
The Arrehnius model is the model that most
directly expresses the thermal transition.
In 1899, S.T. Arrehnius proposed the formula
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As the temperature
of a gas rises, the motion velocity increases
in the molecules that make up the gas. However,
the gas contains a mixture of fast-moving
and slow-moving molecules, and if we posit
that the velocity distribution conforms
to the negative exponential distribution
in relation to (1/T), then in particular
the activated molecules abounding in energy
are what is actually contributing to the
reaction, and the proportion of activated
molecules increases markedly along with
rising temperature. It has been proposed
that the chemical reaction between two gases
can only be contributed to by molecules
with relative motion energy that exceeds
activation energy level E. Therefore, in
isothermal reactions in this type of molecular
collision between two gases, the explanation
of formula (3.1) applies to the proportion
of exp(-E/RT), which is the proportion of
activated molecules with energy above a
certain energy limit value. However, because
this theory cannot be properly applied to
more complex reactions in which numerous
molecules participate, in 1935 H. Eyring
and E.H. Eyring proposed the absolute reaction
theory that was developed from this approach.
This approach holds that activation energy
is the main factor in reaction velocity,
and that this can be separated into activation
energy and activation entropy. When T represents
temperature stress and S represents other
stress, reaction velocity K becomes

This is known as the Eyring
formula. This formula is frequently used
in the field of electrical and electronic
equipment. However, no theory has yet been
established that can account for all chemical
reactions. Here,
becomes the constant.
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3-3 Applying
chemical kinetics
Let's
try to adapt these formulas to the field
of electrical and electronic equipment reliability.
Using the aforementioned stress-strength
model, we can conceptually grasp the process
in which physical changes resulting from
stress such as temperature and voltage reduce
durability and lead to failure. Can chemical
kinetics be applied to explain this type
of phenomenon?
If we express the level of stress applied
to a product as x and the level of resulting
deterioration as y, and if we regard y as
a function of x, then we can express the
following relationship.

When there are multiple sources of stress,
we must regard x as a vector, but to simplify
matters, we can make it scalar. Deterioration
with age dy/dt signify reaction velocity,
so we can express this as

Here, when K is a constant, if we integrate
formula (3.4), we get y = Kt. Now, if we
set L as the time in which deterioration
level y reaches product proof stress limit
r, then the y = Kt relationship yields the
relationship
Next, if we substitute formula (3.3) for
this formula, we get

At this point, we can think of the product
being operated. If we have the following
two instances,
(1) Stress voltage is V1, operating temperature
is T1 and the corresponding life is L1,
and the failure rate is 1
(2) Stress voltage is V2, operating temperature
is T2 and the corresponding life is L2,
and the failure rate is 2
Using formula (3.6), we can show both relationships
as

If we attempt
to express this as a failure rate, the mean
life L and the failure rate
of the electrical and electronic equipment
have an inverse function relationship, and
so the above formula becomes
In the above formula, V2/V1
= S is called the stress ratio.
When =
0 in formula (3.7), this becomes the Arrhenius
formula, and is often adapted to temperature-dependent
deterioration phenomena, and is useful for
establishing the acceleration factor when
performing accelerated testing.
In other words, formula (3.7) can be rewritten
in the following way.

In other words, the rate of acceleration
(the acceleration factor) can be found with
the following formula.
The Arrehnius model is widely applied to
reliability testing and failure analysis
of electrical and electronic equipment,
especially to semiconductor devices. That
is to say, semiconductor devices are manufactured
using physical and chemical changes in the
surface layers of material, and rather than
having a structure of complete crystallization
or solidification, they are combined in
an amorphous state. Because of this, the
changes that appear tend to be chemical
rather than physical changes, and so chemical
theory is considered easier to apply.
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