Monitored Burn-in System allows simple switching from dynamic burn-in to monitored burn-in by modifying the software. (optional)

Improving the pattern generator and driver allows burn-in of a variety of devices.

  Synchronous DRAM, Burst SRAM, RAM(up to 4Gbit static/dynamic devices), System LSI
  EPROM, EEPROM, Mask ROM, Flash memory, MPU, ASIC, Gate arrays

Model Pattern types Specification MBI-2 Memory, MPU, System LSI Number of channels : 48ch VIH +1.5V to +7V PS1 +1.0 to +10.0V/16A