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Evaluation Systems
Ion Migration Evaluation System ( AMI Series )
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About Specification ÞIÞvÞVÞöÞ-
     

Option

   
Measurement voltage

High voltage (up to 500V DC)

 
 
Applied stress voltage

High voltage (up to 500V DC)
DC pulse/AC voltage

 
 
Software for checking conduct mode after leak-touch

 

 
 
LAN application Software

 

 
 
Data processing software (with statistical work function)

 

   
Without leak-touch detection function

 

 
 
Additional measurement cable

 

 
 
Extended cable that connects the scanner unit and the connection unit

Standard 2.5m is changed to 4m.

   
Sample holder for applying specimen inside the chamber

 

 
 
Test board rack type A

 

   
SIR test coupon type IPC-B-24


   
Additional 25 channels

 

   

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