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| Number of channels | Standard 500 channels, and can be expanded to a maximum 1000 channels | |
|---|---|---|
| Software | Operating system Windows 7 | |
| Instrumentation control | Stress voltage application range | 1.0 to 100 V DC (can be changed in 0.1 V increments up to 50 V and 1 V increments above 50 V) |
| Power supply capacity | 100 V, 3 A (1 power supply mounted per 100 channels), in series with a condenser per channel When a protective resistor 10 kΩ is connected |
|
| Resistance measurement range | 10kΩ to 100MΩ (at DC1V to 100V) | |
| Measurement speed | 3 sec. or less per channel (varies depending on condenser capacity) | |
| Test condition setting unit | Units of 25 channels. Select test channel in 1-channel units. Applied voltage is in units of 100 channels. | |
| Control unit | 500 channels | |
| Fault determination standard (4 types) |
1. Insulation resistance limit 1 (insulation resistance value, test stop), 2. Insulation resistance limit 2 (insulation resistance value, failure display only), 3. Change value limit (change value from initial value, test stop), 4. Change rate limit (change rate from initial value, test stop); Test stop is only for the channel where the failure occurred. | |
| Test condition setting unit | 1. Cancel: Cancels all test channels (automatic control to specified temperature and humidity), 2. Forced termination: Select to end testing on all channels or a desired channel | |
| Data processing | Operation status display | Test temperature/humidity, remaining number of samples, number of failures, total/section failure rate, test conditions, available disk space, resistance value by test unit/channel, and failure status |
| Graph display | Graph display of test unit units (25 channels) and insulation resistance value per channel | |
| Data display and data conversion | Display of failures by test unit units, display of insulation resistance value per channel, text data and secondary data conversion (for data analysis software) function | |
| Data analysis | Histogram | Histogram of number of failures by test time, X axis: time divided by segment, Y axis: number of failures |
| Failure rate curve | Failure rate graph by test time, X axis: test time, Y axis: failure rate by measurement time | |
| Weibull analysis | Weibull plot and parameter estimate calculation of m, η, γ, MTTF, δ, and median | |
| Failure data | Select by insulation resistance limit 1, insulation resistance limit 2, change value limit, and change rate limit | |
| Data analysis | Valid only after test is complete | |
| Sample mounting jig | Test substrate mounting type, contact pin type, etc. | |
| Hot chamber | High temperature & humidity chamber or hot chamber | |
| Utility requirements (excluding chamber) | AC100V 1φ15A、AC200V 1φ30A | |
* The contents herein are subject to change without notice.
* Windows is a registered trademark of Microsoft Corporation in the United States.
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